정회주, 오의상, 백승민, 윤형신, 유재성, 이상환 (SK hynix America), 이용준, Arharha, Brett (Microsoft), Yang Zhou, 김남성 (UIUC)

Abstract

1 Introduction

2 Background

3 Deep Dive of DRAM Device Architectures to Identify Precise Fault Locations

4 DRAM Fault Classification: Methodology

5 Large Scale DRAM Field Study

6 DRAM Fault Analyzer (DFA): A method for sharing domain knowledge

7 Related Work

8 Conclusion

Acknowledgements